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Journal Articles

Orientation dependence of yield strength in a new single crystal-like FeCrAl oxide dispersion strengthened alloy

Aghamiri, S. M. S.*; Sugawara, Naoya*; Ukai, Shigeharu; Ono, Naoko*; Sakamoto, Kan*; Yamashita, Shinichiro

Materials Characterization, 176, p.111043_1 - 111043_6, 2021/06

https://doi.org/10.1016/j.matchar.2021.111043

Advanced oxidation-resistant FeCrAl ODS alloys were developed via the control of composition-processing conditions for the accident tolerant fuel (ATF) cladding. For the first time, a single-crystal like recrystallized FeCrAl ODS alloy was achieved with a unique crystallographic texture of 110-plane and 211-direction and a high number density of fine nanoscale oxide particles. Evaluation of yield strengths at different temperatures showed higher values in transverse (T) direction than longitudinal (L) direction. The crystal orientation dependence of the yield strength up to 800$$^{circ}$$C was attributed to lower value of Schmid factor in transverse direction. Accordingly, the critical resolved shear stress of this practical class of advanced materials was calculated in various temperatures.

Journal Articles

Influence of carbon concentration and magnetic transition on the austenite lattice parameter of 30Mn-C steel

Tomota, Yo*; Murakami, Toshio*; Wang, Y. X.*; Omura, Takahito*; Harjo, S.; Su, Y. H.; Shinohara, Takenao

Materials Characterization, 163, p.110243_1 - 110243_8, 2020/05

https://doi.org/10.1016/j.matchar.2020.110243
 Times Cited Count：4 Percentile：32.01(Materials Science, Multidisciplinary)

Journal Articles

An Unreported precipitate orientation relationship in Al-Zn-Mg based alloys

Bendo, A.*; Matsuda, Kenji*; Lervik, A.*; Tsuru, Tomohito; Nishimura, Katsuhiko*; Nunomura, Norio*; Holmestad, R.*; Marioara, C. D.*; Shimizu, Kazuyuki*; Toda, Hiroyuki*; et al.

Materials Characterization, 158, p.109958_1 - 109958_7, 2019/12

https://doi.org/10.1016/j.matchar.2019.109958
 Times Cited Count：21 Percentile：81.08(Materials Science, Multidisciplinary)

Characterization of precipitates in Al-Zn-Mg alloys, using a combination of electron diffraction, bright field transmission electron microscopy and atomic scale scanning transmission electron microscopy imaging revealed the presence of an unreported $$eta$$$$_{13}$$ orientation relationship between the $$eta$$-MgZn$$_2$$ phase and the Al lattice with the following orientation relationship (0001)$$eta$$ $$||$$ (120)$$_{rm Al}$$ and ($$2bar{1}bar{1}0$$)$$eta$$ $$||$$ (001)$$_{rm Al}$$, plate on (120)$$_{rm Al}$$. The precipitate interfaces were observed and analyzed along two projections 90$$^{circ}$$ to one-another. The precipitate coarsening was through the common thickening ledge mechanism. The ledges were significantly stepped along one lateral direction. An interface relaxation model using density functional theory was carried out to explain the precipitate behavior.

Journal Articles

Evaluation of austenite volume fraction in TRIP steel sheets using neutron diffraction

Xu, P. G.; Tomota, Yo*; Arakaki, Yu; Harjo, S.; Sueyoshi, Hitoshi*

Materials Characterization, 127, p.104 - 110, 2017/05

https://doi.org/10.1016/j.matchar.2017.02.028
 Times Cited Count：43 Percentile：93.45(Materials Science, Multidisciplinary)

Journal Articles

Influence of O$$_{2}$$ incident energy for initial sticking probability and product SiO desorption rate on Si(001) surfaces

Teraoka, Yuden; Yoshigoe, Akitaka

Proceedings of 3rd International Symposium on Atomic Level Characterizations for New Materials and Devices '01 (ALC '01), p.341 - 344, 2001/11

no abstracts in English

Journal Articles

SPM investigation of C$$_{60}$$ thin films irradiated with energetic ions

Narumi, Kazumasa; Naramoto, Hiroshi

Proceedings of 3rd International Symposium on Atomic Level Characterizations for New Materials and Devices '01 (ALC '01), p.322 - 325, 2001/11

Transformation of C$$_{60}$$ thin films on Si(111) substrates by irradiation with 360 keV $$^{40}$$Ar$$^{+}$$ and $$^{40}$$Ar$$^{4+}$$ ions at fluences of 1.0$$times$$10$$^{12}$$/cm$$^{2}$$ to 1.1$$times$$10$$^{16}$$/cm$$^{2}$$ was investigated by atomic force microscopy. As-prepared insulating films become conductive after the irradiation up to the fluence of 1.1$$times$$10$$^{14}$$/cm$$^{2}$$, where the film is found to be almost transformed into a form of amorphous carbon by Raman-spectroscopy analysis. This results from conductive carbon species due to decomposition of the C$$_{60}$$ molecule. Considerable topographic change is observed up to the fluence of 1.1$$times$$10$$^{15}$$/cm$$^{2}$$ where the lines characteristic of the C$$_{60}$$ film fade out of the Raman spectra, which is due to sputtering and to densification of the C$$_{60}$$ molecule.

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